21![Ultimate Resolution of AFM in Air The Preservation of Tip and Sample is a Critical Factor The Ultimate Resolution of Atomic Force Microscope “What is the ultimate resolution of AFM in air?” As significant as the answ Ultimate Resolution of AFM in Air The Preservation of Tip and Sample is a Critical Factor The Ultimate Resolution of Atomic Force Microscope “What is the ultimate resolution of AFM in air?” As significant as the answ](https://www.pdfsearch.io/img/04dcaffb5c1965ff2d9cdc4eaeb76776.jpg) | Add to Reading ListSource URL: www.nanowerk.comLanguage: English - Date: 2009-12-22 18:00:00
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22![WITec Microscopy System Selector Large area automated sample investigations (150 x 100 mm) for Raman, AFM, and Raman-AFM combinations WITec Microscopy System Selector Large area automated sample investigations (150 x 100 mm) for Raman, AFM, and Raman-AFM combinations](https://www.pdfsearch.io/img/be776d153681bfd19b5a9f75ed7e3c16.jpg) | Add to Reading ListSource URL: www.witec.deLanguage: English - Date: 2014-10-14 09:29:48
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23![](https://www.pdfsearch.io/img/d076e5f8aefe84fe0c6c7e022de41509.jpg) | Add to Reading ListSource URL: www.nanowerk.comLanguage: English - Date: 2013-10-28 06:25:22
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24![](https://www.pdfsearch.io/img/3a8a328274340d9406150a0abcf8818e.jpg) | Add to Reading ListSource URL: www.nanowerk.comLanguage: English - Date: 2013-10-28 06:25:22
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25![Microsoft PowerPoint - ENGS-AFM [Compatibility Mode] Microsoft PowerPoint - ENGS-AFM [Compatibility Mode]](https://www.pdfsearch.io/img/7c4500e2cf95d5afc049783461a05e76.jpg) | Add to Reading ListSource URL: nanofab.caltech.eduLanguage: English - Date: 2013-01-21 22:21:44
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26![Dimension FastScan The World’s Fastest AFM Innovation with Integrity Dimension FastScan The World’s Fastest AFM Innovation with Integrity](https://www.pdfsearch.io/img/e0f3d02ea7b174a1979dc428014ffbcb.jpg) | Add to Reading ListSource URL: www.nanowerk.comLanguage: English - Date: 2013-10-28 06:25:22
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27![Critical Dimensions Measurement of High Aspect Ratio Trench with XE AFM >>> Figure 1. (a) XE Scan System separates the Z-scanner from Critical Dimensions Measurement of High Aspect Ratio Trench with XE AFM >>> Figure 1. (a) XE Scan System separates the Z-scanner from](https://www.pdfsearch.io/img/badda5d1d2d27b2f8bda2e1d0efd131c.jpg) | Add to Reading ListSource URL: www.nanowerk.comLanguage: English - Date: 2011-11-12 18:00:00
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28![Automatic Defect Review AFM for Hard Disk Media and Substrates Nanotechnology Solutions Partner For more information: www.parkAFM.com Automatic Defect Review AFM for Hard Disk Media and Substrates Nanotechnology Solutions Partner For more information: www.parkAFM.com](https://www.pdfsearch.io/img/3c4d0ebc49815d3091ad92d00a3e53ad.jpg) | Add to Reading ListSource URL: www.nanowerk.comLanguage: English - Date: 2011-11-12 18:00:00
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29![AFM for biological applications
LIFE setup and measuring head lifting mechanism Development of an AFM for biological applications is always a tricky problem because it requires AFM integration with an Inverted Light Mi AFM for biological applications
LIFE setup and measuring head lifting mechanism Development of an AFM for biological applications is always a tricky problem because it requires AFM integration with an Inverted Light Mi](https://www.pdfsearch.io/img/632e974348db569f62ff494aa3cd5380.jpg) | Add to Reading ListSource URL: www.ntmdt.ruLanguage: English - Date: 2012-12-13 04:14:09
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30![Flexible integrated research AFM
OPEN is a fully automated desktop AFM. It is much more than just topography imaging tool. Coupled with PX Ultra controller, the OPEN provides the largest suite of AFM measuring techniqu Flexible integrated research AFM
OPEN is a fully automated desktop AFM. It is much more than just topography imaging tool. Coupled with PX Ultra controller, the OPEN provides the largest suite of AFM measuring techniqu](https://www.pdfsearch.io/img/bd8fe6e4060a705eeb7aabb7f703f516.jpg) | Add to Reading ListSource URL: www.ntmdt.ruLanguage: English - Date: 2012-12-28 07:31:35
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